JPS5931033A - 半導体等のエ−ジング装置 - Google Patents

半導体等のエ−ジング装置

Info

Publication number
JPS5931033A
JPS5931033A JP57139718A JP13971882A JPS5931033A JP S5931033 A JPS5931033 A JP S5931033A JP 57139718 A JP57139718 A JP 57139718A JP 13971882 A JP13971882 A JP 13971882A JP S5931033 A JPS5931033 A JP S5931033A
Authority
JP
Japan
Prior art keywords
semiconductors
connector
aging device
connector module
aging
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP57139718A
Other languages
English (en)
Japanese (ja)
Other versions
JPS637629B2 (en]
Inventor
Tatsuo Hayashida
林田　辰雄
Takeshi Fukushiro
福代　毅
Ryuichi Takagi
隆一 高木
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP57139718A priority Critical patent/JPS5931033A/ja
Publication of JPS5931033A publication Critical patent/JPS5931033A/ja
Publication of JPS637629B2 publication Critical patent/JPS637629B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2642—Testing semiconductor operation lifetime or reliability, e.g. by accelerated life tests

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
JP57139718A 1982-08-13 1982-08-13 半導体等のエ−ジング装置 Granted JPS5931033A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57139718A JPS5931033A (ja) 1982-08-13 1982-08-13 半導体等のエ−ジング装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57139718A JPS5931033A (ja) 1982-08-13 1982-08-13 半導体等のエ−ジング装置

Publications (2)

Publication Number Publication Date
JPS5931033A true JPS5931033A (ja) 1984-02-18
JPS637629B2 JPS637629B2 (en]) 1988-02-17

Family

ID=15251787

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57139718A Granted JPS5931033A (ja) 1982-08-13 1982-08-13 半導体等のエ−ジング装置

Country Status (1)

Country Link
JP (1) JPS5931033A (en])

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0310276U (en]) * 1989-06-16 1991-01-31

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0310276U (en]) * 1989-06-16 1991-01-31

Also Published As

Publication number Publication date
JPS637629B2 (en]) 1988-02-17

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